As consumers demand smaller, faster computer systems, OEM design engineers race to create systems with compact, more powerful microprocessors and chipsets. However, these compressed designs provide engineers with a new enemy…heat. In minutes, densely packaged microprocessors or compact electronic systems can generate enough heat to destroy years worth of work. A design engineer … [Read more...]
Company Certified for Energy Consumption Monitoring on Product Line
Raritan and Universal Electric Corp. announced interoperability between Power IQ energy management software and STARLINE Track Busway, giving data center managers a more complete picture of how energy is being consumed -- from the room's power distribution busway all the way to a server in the rack -- in order to better manage resources and take energy cost-reduction … [Read more...]
ORNL Energy Harvesters Transform Waste into Electricity
Billions of dollars lost each year as waste heat from industrial processes can be converted into electricity with a technology being developed at the Department of Energy's Oak Ridge National Laboratory. The high-efficiency thermal waste heat energy converter actively cools electronic devices, photovoltaic cells, computers and large waste heat-producing systems while generating … [Read more...]
NANOPACK Workshop on Thermal Management
May 23-24, Palaiseau, France The European Commission ICT theme is funding since 2007 our large-scale project entitled “NANOPACK - Nano Packaging Technology for Interconnect and Heat Dissipation.” The 14 partners of the project include major industries such as Thales (France), Bosch (Germany), IBM (Zürich Research Laboratories), SMEs and different academic teams throughout … [Read more...]
Hot STM Captures Thermal Decomposition in situ at the Nanoscale
A new report in the journal Nanotechnology offers findings of a nanoscale in situ investigation of ultrathin silicon oxide thermal decomposition by high temperature scanning tunneling microscopy. A surface chemical reaction—the thermal decomposition of ultrathin silicon oxide (~1 nm) by ultrahigh vacuum (UHV) thermal annealing at 600–800 °C—is in situ investigated on a … [Read more...]
- « Previous Page
- 1
- …
- 125
- 126
- 127
- 128
- 129
- …
- 163
- Next Page »